Author: Castro Carballo, M.E.
Paper Title Page
THOYGD2
Experimental Slice Emittance Reduction at PITZ Using Laser Pulse Shaping  
 
  • R. Niemczyk, Z. Aboulbanine, G.D. Adhikari, N. Aftab, P. Boonpornprasert, G.Z. Georgiev, J. Good, M. Groß, C. Koschitzki, X.-K. Li, O. Lishilin, D. Melkumyan, S.K. Mohanty, A. Oppelt, H.J. Qian, H. Shaker, G. Shu, F. Stephan, T. Weilbach
    DESY Zeuthen, Zeuthen, Germany
  • M.E. Castro Carballo, M. Krasilnikov, G. Vashchenko
    DESY, Hamburg, Germany
  • W. Hillert
    University of Hamburg, Institut für Experimentalphysik, Hamburg, Germany
 
  Free-electron lasers in the X-ray regime require a high-brightness electron beam, i.e. an electron beam with high current and low transverse emittance. At the Photo Injector Test facility at DESY in Zeuthen (PITZ) high-brightness electron sources are optimized for the use at FLASH and European XFEL. A low transverse emittance of the electron beam’s central part, which is assumed to be the lasing slices, is of particular interest for the efficient FEL operation. Over the past years a slice emittance measurement scheme has been developed at PITZ which employs an rf deflector and additional quadrupole magnets along the beamline to the standard measurement procedure for the projected emittance (single-slit scan). It allows measuring the slice emittance in a high-brightness photo injector. Transversely flat-top shaped laser pulses of different temporal distributions (Gaussian and flat-top) have been used to emit electrons, as well as transversely-truncated Gaussian laser pulses with temporal Gaussian shape. The paper shows that the lowest slice emittance in the injector is reached with a temporal flattop shape, or when using a transversely-truncated Gaussian shape.  
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