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BiBTeX citation export for TUPOTK042: Challenges to Reliable Production Nitrogen Doping of Nb for SRF Accelerating Cavities

@inproceedings{reece:ipac2022-tupotk042,
  author       = {C.E. Reece and J.W. Angle and M.J. Kelley and E.M. Lechner and A.D. Palczewski and F.A. Stevie},
  title        = {{Challenges to Reliable Production Nitrogen Doping of Nb for SRF Accelerating Cavities}},
  booktitle    = {Proc. IPAC'22},
% booktitle    = {Proc. 13th International Particle Accelerator Conference (IPAC'22)},
  pages        = {1311--1314},
  eid          = {TUPOTK042},
  language     = {english},
  keywords     = {cavity, niobium, SRF, vacuum, controls},
  venue        = {Bangkok, Thailand},
  series       = {International Particle Accelerator Conference},
  number       = {13},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {07},
  year         = {2022},
  issn         = {2673-5490},
  isbn         = {978-3-95450-227-1},
  doi          = {10.18429/JACoW-IPAC2022-TUPOTK042},
  url          = {https://jacow.org/ipac2022/papers/tupotk042.pdf},
  abstract     = {{Over the last several years, alloying of the surface layer of niobium SRF cavities has been demonstrated to beneficially lower the superconducting RF surface resistance. Nitrogen, titanium, and oxygen have all been demonstrated as effective alloying agents, occupying interstitial sites in the niobium lattice within the RF penetration depth and even deeper, when allowed to thermally diffuse into the surface at appropriate temperatures. The use of nitrogen for this function has been often termed ’nitrogen doping’ and is being applied in the LCLS-II and LCLS-II HE projects. We report characterization studies of the distribution of nitrogen into the exposed niobium surface and how such distribution is affected by the quality of the vacuum furnace environment in which the doping takes place, and the complexity of nitride crystal growth on different grain orientations of surface niobium. Using state-of-the-art quantification methods by dynamic secondary ion mass spectrometry (SIMS) depth profiling in niobium, we identify several phenomena involving furnace-sourced contamination. We also highlight a potential issue with N₂ flow constraints from the flange ’caps’ used during heat treatments.}},
}