Machine Learning Applied for the Calibration of the Hard X-Ray Single-Shot Spectrometer at the European XFEL

Grech, Christian; Geloni, Gianluca; Guetg, Marc

doi:10.18429/JACoW-IPAC2022-TUPOST046

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Text/Word citation export for TUPOST046: Machine Learning Applied for the Calibration of the Hard X-Ray Single-Shot Spectrometer at the European XFEL

C. Grech, G. Geloni, and M.W. Guetg, “Machine Learning Applied for the Calibration of the Hard X-Ray Single-Shot Spectrometer at the European XFEL”, in Proc. IPAC'22, Bangkok, Thailand, Jun. 2022, pp. 965-968. doi:10.18429/JACoW-IPAC2022-TUPOST046